Software Vulnerability Overview A Concise Study Software Vulnerability Overview A Concise Study Soft

Abstract:

AVF identifies the fraction of faults that result in a user-visible error for a transistor, bit, or structure. The circuit-level error rate needs to be derated (or multiplied) by the AVF to obtain the overall SER for the component in question. AVFs can vary widely—from 0% to 100%. To reduce the overall SER of the chip under design, designers can choose structures with relatively high bit count and high AVF as candidates for protection. The SDC FIT of a bit can be expressed as the product of its SDC AVF and circuit-level SER. Similarly, the DUE FIT of a bit can be expressed as the product of its DUE AVF and circuit-level SER. The DUE AVF of a bit is the sum of the true and false DUE AVFs. The true DUE AVF of a bit is its SDC AVF without any error detection.