Data Driven Reliability Models of Quantum Circuit From Traditional ML to Graph Neural Network

The current advancement in quantum computers has been focusing on increasing the number of qubits and enhancing their fidelity. However, the available quantum devices, known as intermediate scale quantum (NISQ) computers, still suffer from different sources of noise that impact their reliability. Thus, practical noise modeling is of great importance in the development of quantum error mitigation approaches. In this article, we propose a machine learning (ML)-based scheme to predict the output fidelity of the quantum circuit executed on NISQ devices. We show the benefit of using graph neural network (GNN)-based models compared to traditional ML-based models in capturing the quantum circuit structure in addition to its gates’ features, which enable characterizing unpredicted quantum circuit errors. We use different metrics to measure the fidelity of the quantum circuit output. Our experimental results using different quantum algorithms executed on IBM Q Guadalupe quantum computer show the high prediction accuracy of our ML reliability models. Our results also show that our models can guide the single-qubit gate rescheduling to improve the output fidelity of the quantum circuit without the need for prior execution of dedicated calibration circuits.